Details
Instruments details
Molecular Beam-IR integrated instrument
Surface Area Analyser (XPS & Profilometer)
- 2086
- cp.vinod@ncl.res.in
- http://academic.ncl.res.in/cp.vinod
- Installed on 2005
Scientist Incharge
Moderators
Address
| Title | External Charges | Sample Processing Charges | Miscellaneous Charges |
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