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Details

Instruments details

XPS (ESCA)

Surface Area Analyser (XPS & Profilometer)

Equipment Details : X_ray Photo Spectrometer and UPS Model- K ALPHA + Make- M/s Thermo Fisher Scientific Instruments UK Vacuum details- a) load lock chamber(Sample loading chamber)- 1.2 X 10*-8 mbar. b) Analyser chamber- 2 X 10*-9 mbar. X-Ray Source- Al K Alfa ( Monochromatic) with 6 ma beam current and 12KV. Instrument is calibrated with Ag3d 352eV Spot Size on the sample- 400 Micrometer Reference for Binding energy- C1s, 284.8eV,S/w:- Avantage Heating:- 120 degrees for bake out and 20 degrees cooling for TMP and

Capabilities : (a) XPS Analysis. (b) UPS Analysis. (c) Depth profile analysis with argon sputtering. (d) Mapping and (e) Valence band measurement. X-Ray Photo-electron spectroscopy (XPS) is suitable for analysis of Metals, Bio-Materials, Oxides, Glass, Fibres, Ceramics, Nano-Materials, Powders, Plastics and Polymers.

2250
cp.vinod@ncl.res.in
http://academic.ncl.res.in/cp.vinod
Installed on 2017

Scientist Incharge

Shriniwas Deo (967)

Vinod Prabhakaran (2443)

Moderators

Shriniwas Deo (967)

Vinod Prabhakaran (2443)

Umesh Katamkar (2430)

Niteen Baliram Dabke (45328)

Address

Centre for Material Characterisation Ground Floor 1702 CMC (Center for Materials Characterization)

Downtime : 07-05-2024 14:18:00 - 17-05-2024 22:15:00

Requisition Form : XPS UPS

Book Test

Analysis :

Id	Title	External Charges	Miscellaneous Charges
125	Normal XPS	6000	0
126	Normal UPS	9000	0
179	Normal XPS+UPS	14000
180	XPS+ data analysis (Peak fitting, composition analysis)	15000
181	XPS + Mapping	15000
182	XPS + Depth Profiling	15000
183	ESCA (under near-ambient conditions)	50000