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020 25902641
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caf.office@ncl.res.in
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Instruments details
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Instruments
Field Emission Scanning Electron Microscope (FESEM), FEI – NOVA NANO 450
Microscopy Facility
Equipment Details :
FEI NOVA NANOSEM 450. Resolution : 1nm, Acceleratiting Voltage : 1kV - 30kV.
Capabilities :
High resolution imaging and surface morphology at nanometer scale in High Vacuum and Low Vacuum mode. EDX ( Energy Dispersive X-ray Spectroscopy) analysis and elemental mapping.
02025902864
rs.gholap@ncl.res.in
Installed on
2013
Scientist Incharge
Kaliaperumal Selvaraj (2293)
Moderators
Ramakrishna Gholap (1323)
Chetan Barhate (45255)
Address
Centre for Material Characterisation
Ground Floor
CMC (Center for Materials Characterization)
Downtime :
13-05-2024 17:24:00
-
21-05-2024 13:00:00
Requisition Form :
FE-SEM
Book Test
Analysis :
Id
Title
External Charges
Sample Processing Charges
Miscellaneous Charges
37
FESEM
7000
38
FESEM+EDX
9000
62
FESEM+EDX+Mapping
12000
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