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020 25902641
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caf.office@ncl.res.in
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Instruments details
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Instruments
Environmental Scanning Electron Microscope (ESEM), FEI – Quanta 200-3D
Microscopy Facility
Equipment Details :
FEI - QUANTA 200 3D. Resolution : 50nm, Accelerating Voltage : 500V - 30kV.
Capabilities :
Surface morphology at nanometer scale in High Vacuum, Low Vacuum and ESEM (Environmental) mode. EDX ( Energy Dispersive X-ray Spectroscopy) analysis and elemental mapping.
02025902736
rs.gholap@ncl.res.in
Installed on
2007
Scientist Incharge
Kaliaperumal Selvaraj (2293)
Moderators
Ramakrishna Gholap (1323)
Preeti Lahare (45570)
Address
Centre for Material Characterisation
Ground Floor
1709
CMC (Center for Materials Characterization)
Downtime :
02-03-2023 09:30:00
-
31-03-2023 05:30:00
Requisition Form :
SEM
Book Test
Analysis :
Id
Title
External Charges
Sample Processing Charges
Miscellaneous Charges
33
SEM
4000
34
SEM+EDX
6000
35
SEM+Mapping
7000
36
SEM+EDX+Mapping
9000
59
SEM(Low vacuum mode)
5000
60
SEM(Low vacuum mode)+EDX
7000
61
E-SEM Mode
7000
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