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Details

Instruments details

Atomic Force Microscope (AFM)

Microscopy Facility

Equipment Details : Name of the Facility Atomic Force Microscopy Model No: S-SPM-00001 Make: CS Instrument

Capabilities : AFM Nano observer System is low noise compact sample scanning SPM. It operates both contact and dynamic modes including: Contact mode/Friction (lateral force), Oscillating mode (tapping ). It also include Resiscope module for quantitative Resistance/Current measurement Advanced Electrical Measurements: HD-KFM: Double lock in extension ( includes MFM/EFM and HD KFM) Option for Magnetic field, electric field and high definition KFM

2540
rg.gonnade@ncl.res.in
http://academic.ncl.res.in/rg.gonnade
Installed on 2024

Scientist Incharge

Rajesh Gonnade (2226)

Moderators

Rupali Waichal (2270)

Jagruti Kurkure (45349)

Address

Centre for Material Characterisation Ground Floor 1715 CMC (Center for Materials Characterization)

Requisition Form : AFM

Book Test

Analysis :

Id	Title	External Charges	Sample Processing Charges	Miscellaneous Charges
381	Contact Mode
382	Tapping Mode
383	Conductive (CFM)
384	Piezo Responsive (PFM)
385	Electric (EFM)
386	Magnetic (MFM)
387	Kelvin Probe (KPFM)
388	SThM
389	STM