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Details

Instruments details

FIELD EMISSION SCANNING ELECTRON MICROSCOPE (FESEM) FEI-APREO CHEMISEM

Microscopy Facility

Equipment Details : FEI Apreo ChemiSEM. Resolution: 0.8 to 0.5nm at Accelerating Voltage: 1 to 15kV.

Capabilities : Ultra High resolution imaging and surface morphology at nanometre scale in High Vacuum and Low Vacuum mode with integrated EDX (Energy Dispersive X-ray Spectroscopy) analysis, elemental and Phase mapping.

2864
rs.gholap.ncl@csir.res.in
Installed on 2025

Scientist Incharge

Kaliaperumal Selvaraj (2293)

Moderators

Ramakrishna Gholap (1323)

Chetan Barhate (45255)

Address

Centre for Material Characterisation Ground Floor FE-SEM Room, Central Microscopy Facility (CMF) Bui CMC (Center for Materials Characterization)

Downtime : 01-09-2025 09:00:00 - 25-09-2025 15:00:00

Requisition Form : FESEM FEI – Apreo ChemiSEM

Book Test

Analysis :

Id	Title	External Charges	Sample Processing Charges	Miscellaneous Charges
407	FESEM (ChemiSEM)
408	FESEM+EDS (ChemiSEM)
409	FE-SEM+EDS+Mapping (ChemiSEM)