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Email:
caf.office@ncl.res.in
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Instruments details
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Instruments
XPS (ESCA)
Surface Area Analyser (XPS & Profilometer)
Equipment Details :
X_ray Photo Spectrometer and UPS Model- K ALPHA + Make- M/s Thermo Fisher Scientific Instruments UK Vacuum details- a) load lock chamber(Sample loading chamber)- 1.2 X 10*-8 mbar. b) Analyser chamber- 2 X 10*-9 mbar. X-Ray Source- Al K Alfa ( Monochromatic) with 6 ma beam current and 12KV. Instrument is calibrated with Ag3d 352eV Spot Size on the sample- 400 Micrometer Reference for Binding energy- C1s, 284.8eV,S/w:- Avantage Heating:- 120 degrees for bake out and 20 degrees cooling for TMP and
Capabilities :
(a) XPS Analysis. (b) UPS Analysis. (c) Depth profile analysis with argon sputtering. (d) Mapping and (e) Valence band measurement. X-Ray Photo-electron spectroscopy (XPS) is suitable for analysis of Metals, Bio-Materials, Oxides, Glass, Fibres, Ceramics, Nano-Materials, Powders, Plastics and Polymers.
2250
cp.vinod@ncl.res.in
http://academic.ncl.res.in/cp.vinod
Installed on
2017
Scientist Incharge
Shriniwas Deo (967)
Vinod Prabhakaran (2443)
Moderators
Shriniwas Deo (967)
Vinod Prabhakaran (2443)
Umesh Katamkar (2430)
Niteen Baliram Dabke (45328)
Address
Centre for Material Characterisation
Ground Floor
1702
CMC (Center for Materials Characterization)
Downtime :
07-05-2024 14:18:00
-
17-05-2024 22:15:00
Requisition Form :
XPS UPS
Book Test
Analysis :
Id
Title
External Charges
Sample Processing Charges
Miscellaneous Charges
125
Normal XPS
6000
0
0
126
Normal UPS
9000
0
0
179
Normal XPS+UPS
14000
0
180
XPS+ data analysis (Peak fitting, composition analysis)
15000
0
181
XPS + Mapping
15000
0
182
XPS + Depth Profiling
15000
0
183
ESCA (under near-ambient conditions)
50000
0
User details
Umesh Katamkar
Designation :
Sr. Technical Officer(1)
Phone :
9.92161e+009
Email :
un.katamkar@ncl.res.in