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Details

Instruments details

Field Emission Scanning Electron Microscope (FESEM), FEI – NOVA NANO 450

Microscopy Facility

Equipment Details : FEI NOVA NANOSEM 450. Resolution : 1nm, Acceleratiting Voltage : 1kV - 30kV.

Capabilities : High resolution imaging and surface morphology at nanometer scale in High Vacuum and Low Vacuum mode. EDX ( Energy Dispersive X-ray Spectroscopy) analysis and elemental mapping.

02025902864
rs.gholap@ncl.res.in
Installed on 2013

Scientist Incharge

Kaliaperumal Selvaraj (2293)

Moderators

Ramakrishna Gholap (1323)

Chetan Barhate (45255)

Address

Centre for Material Characterisation Ground Floor CMC (Center for Materials Characterization)

Downtime : 13-05-2024 17:24:00 - 21-05-2024 13:00:00

Requisition Form : FE-SEM

Book Test

Analysis :

Id	Title	External Charges
37	FESEM	7000
38	FESEM+EDX	9000
62	FESEM+EDX+Mapping	12000