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Details

Instruments details

High Resolution Transmission Electron Microscope (HRTEM ), JEOL JEM F200

Microscopy Facility

Equipment Details : JEOL JEM F200 HRTEM. Rsolution : 0.19 nm, Accelerating Voltage : 20kV-200kV

Capabilities : High resolution imaging with Bright Field Detector, Dark Field Detector, Electron Diffraction, EDX ( Energy Dispersive X-ray Spectroscopy) analysis and elemental mapping. Normal STEM(Scanning Transmission Electron Microscopy) imaging with HAADF Detector, Bright Field Detector, Dark Field Detector and HRSTEM analysis with elemental mapping.

02025902864
rs.gholap@ncl.res.in
Installed on 2017

Scientist Incharge

Kaliaperumal Selvaraj (2293)

Moderators

Ramakrishna Gholap (1323)

Address

Centre for Material Characterisation Ground Floor CMC (Center for Materials Characterization)

Downtime : 23-09-2024 00:00:00 - 12-10-2024 00:00:00

Requisition Form : HRTEM

Book Test

Analysis :

Id	Title	External Charges
39	HRTEM (Bright Field Detector+Dark Field Detector+Electron Diffraction)	15000
40	HRTEM+EDX	17000
41	Normal STEM Imaging (HAADF Detector+Bright Field Detector+Dark Field Detector)	20000
42	HRSTEM+Mapping	25000